Seminar: Thin Film Metrology

Optical Methods and Applications for Thin Film Analysis

Jun 25, 2013

Radisson Blu Hotel Dortmund, An der Buschmuehle 1, D-44139 Dortmund/Germany

SENTECH Instruments develops, manufactures, and sells worldwide advanced quality instrumentation for Thin Film Measurement, Photovoltaics and Plasma Process Technology.

The seminar on "Thin Film Metrology" focuses on optical methods and applications for thin film analysis. Principles of spectroscopic ellipsometry, reflectometry and transmission measurements are presented. Contributions from experts cover the analysis of new materials, solar cells and nano technology with a special focus on industrial quality control.

The seminar is free of charge.

Links

SENTECH Instruments GmbH

Downloads

Program and registration form

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