IVAM Microtechnology Network
The Fraunhofer Research Institution for Electronic Nano Systems ENAS has presented an example for Smart Systems Integration – a smart, active RFID label – at the MicroTechnology/HANNOVER MESSE. The smart label has been developed in the BMBF project ASIL together with several partners (KSW Microtec, ELMOS Semiconductor AG, Schenker Deutschland AG, memsfab GmbH, Chemnitz University of Technology – Center for Microtechnologies ZfM and Fraunhofer ENAS).
The label can be used for monitoring temperatures, inclination and shock during the transportation of valuable commodities such as optical systems or blood preservations. The innovation of the smart label is the detection and storage of mechanical shock and inclination within one sensor system as well as the opportunity for reading out the data via RFID without touching at any time. A special method of thin film encapsulation (TFE) for capping the wafer enables a flexible and resistant system. This cost-efficient packaging also ensures low manufacturing costs for the whole system.
Fraunhofer Research Institution for Electronic Nano Systems ENAS
Andrea Messig-Wetzel
info@enas.fraunhofer.de
www.enas.fraunhofer.de
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