Wearables Meet Hybrid Organic Electronics

In order to stay in contact with our IVAM members during these times,the digital meeting of the IVAM Focus Groups Wearable Electronics and Hybrid Organic Electronics will take place on Monday, April 19 2021, from 3:00 p.m. to 5:00 p.m. This virtual event is carried out together with the COPT Center and examines, among other things, production methods for printed/organic electronics and their applications in the medical, sports and consumer sectors.

Registration for IVAM members

The event will take a closer look at the above-mentioned topics, highlight opportunities for companies from different industries, and provide suggestions for the use of the new technologies. In addition to the lectures, discussion and the opportunity to network will support exchange of knowledge and experience.

The necessary dial-in data for our video conference will be sent out shortly before the event!

Participation in IVAM Focus group meetings is free of charge for association members. Non-members may attend three times. In this case, we charge an administrative fee of € 50.00 (plus VAT), which is also due in case of non-participation. Of course, it is possible to nominate a substitute participant at any time and without additional costs.


Monday, April 19, 2021
Welcome and introduction to IVAM, COPT Center and the Focus Groups
Dr. Thomas Dietrich
IVAM Microtechnology Network, Dortmund, DE
Prof. Klaus Meerholz
COPT Center, Cologne, DE
What technologies exist in the field of printed electronics? What potential does printed electronics have for the medical market?
Nicole Knodel
innoME GmbH, Espelkamp, DE
Applied Research on Smart Functional Textiles
Dr. Jan-Carlos Kuhlmann
SAXION University for Applied Sciences, Enschede, NL
Magos - the next gen Human Computer Interaction Solution
Greg Agriopoulos
MAGOS, Athens, GR
Discussion / Get Together on the topic "Challenge in the integration of components into wearables with complex functions and solutions"
Dr. Manuela Di Biase
COPT Center, Cologne, DE
Erik Jung
Fraunhofer Institute for Reliability and Microintegration IZM, Berlin, DE
Summary and Outlook
End of the event