IVAM Microtechnology Network
FRT presents a new optical film thickness measuring tool. The MicroSpy FT non-destructively measures coatings that are transparent or semi-transparent in the visible and near-infrared spectrum of light.
With its 3D film thickness mapping mode, the tool allows the thickness measurement of entire coating areas to visualize and evaluate the evenness of film thickness distribution, as well as classical point and profile measurements on the coating. Furthermore, self-supported films such as foils, single films or stacked films on a substrate can be characterized.
The tool is used in research and quality control of products in the fields of medical, semiconductor and microsystems technology as well as in photovoltaics, optics and the automotive industry.
FRT Fries Research & Technology GmbH
Dr. Thomas Fries
info@frt-gmbh.com
www.film-thickness.com
www.frt-gmbh.com
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